Control of Parasitic Aberrations in Multipole Corrector Optics

Journal article

Peer reviewed

Control of Parasitic Aberrations in Multipole Corrector Optics

Microscopy and microanalysis, Vol.14(S2), pp.830-831

08/2008

DOI: https://doi.org/10.1017/S1431927608088430

PMID: 18673998

Abstract

Transmission Electron Microscopy Techniques and Applications

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Details

Title: Control of Parasitic Aberrations in Multipole Corrector Optics
Creators: P E Batson - IBM T J Watson Research Center
Publication Details: Microscopy and microanalysis, Vol.14(S2), pp.830-831
Date published: 08/2008
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: Physics and Astronomy (SAS)
Language: English
Resource Type: Journal article
Identifiers: 991031665033704646