Effects of Detector Black Level in ADF-STEM Imaging

Journal article

Peer reviewed

Z Yu, P. E Batson and J Silcox

Microscopy and microanalysis, Vol.8(S02), pp.472-473

08/2002

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Title: Effects of Detector Black Level in ADF-STEM Imaging
Creators: Z Yu - Physics Department, Cornell University, Ithaca, NY 14853
P. E Batson - IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598
J Silcox - School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
Publication Details: Microscopy and microanalysis, Vol.8(S02), pp.472-473
Date published: 08/2002
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: Physics and Astronomy (SAS)
Language: English
Resource Type: Journal article
Identifiers: 991031665285604646