Enhanced sensitivity to oxide surface defects using Auger-photoelectron coincidence spectroscopy

A.K See; W.-K Siu; R.A Bartynski; A Nangia; A.H Weiss; S.L Hulbert; X Wu; C.-C Kao

doi:10.1016/S0039-6028(97)00165-9

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Enhanced sensitivity to oxide surface defects using Auger-photoelectron coincidence spectroscopy

Journal article

Peer reviewed

Enhanced sensitivity to oxide surface defects using Auger-photoelectron coincidence spectroscopy

A.K See, W.-K Siu, R.A Bartynski, A Nangia, A.H Weiss, S.L Hulbert, X Wu and C.-C Kao

Surface science, Vol.383(2), pp.L735-L741

1997

DOI: https://doi.org/10.1016/S0039-6028(97)00165-9

Abstract

Auger ejection

Auger electron spectroscopy

Photoelectron emission

Surface defects

Titanium oxide

We present Auger-photoelectron coincidence (APECS) spectra of the Ti 3p core level obtained in coincidence with Ti M 2.3VV Auger electrons from the stoichiometric and vacuum annealed TiO 2(110) surfaces. For both surfaces, emission corresponding to reduced oxidation states has approximately an order of magnitude greater relative intensity in the coincidence spectrum as compared with the corresponding ordinary (singles) photoemission spectrum. We associate the excess coincidence signal from the stoichiometric surface with previously undetected residual defects. The origins and implications of the enhanced sensitivity of APECS to defects at oxide surfaces is discussed.

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Details

Title: Enhanced sensitivity to oxide surface defects using Auger-photoelectron coincidence spectroscopy
Creators: A.K See - Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers University, P.O. Box 849, Piscataway, NJ 08855-0849, USA
W.-K Siu - Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers University, P.O. Box 849, Piscataway, NJ 08855-0849, USA
R.A Bartynski - Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers University, P.O. Box 849, Piscataway, NJ 08855-0849, USA
A Nangia - Department of Physics and Program in Materials Science, University of Texas at Arlington, P.O. Box 19059, Arlington, TX 76019, USA
A.H Weiss - Department of Physics and Program in Materials Science, University of Texas at Arlington, P.O. Box 19059, Arlington, TX 76019, USA
S.L Hulbert - National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, USA
X Wu - National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, USA
C.-C Kao - National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, USA
Publication Details: Surface science, Vol.383(2), pp.L735-L741
Date published: 1997
Publisher: Elsevier B.V
Academic Unit: Physics and Astronomy (SAS); Laboratory for Surface Modification
Language: English
Resource Type: Journal article
Identifiers: 991031664418204646