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Journal article
Peer reviewed
Experience with the IBM Sub-Angstrom STEM
P. E Batson
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Microscopy and microanalysis, Vol.9(S02), pp.136-137
08/2003
DOI:
https://doi.org/10.1017/S1431927603441196
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Title
Experience with the IBM Sub-Angstrom STEM
Creators
P. E Batson - IBM T.J. Watson Research Center, Yorktown Heights, New York 10598
Publication Details
Microscopy and microanalysis, Vol.9(S02), pp.136-137
Date published
08/2003
Publisher
Cambridge University Press
Number of pages
2
Academic Unit
Physics and Astronomy (SAS)
Language
English
Resource Type
Journal article
Identifiers
991031665717404646
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