High Resolution EELS in the IBM Sub-Angstrom STEM

Journal article

Peer reviewed

Microscopy and microanalysis, Vol.12(S02), pp.1336-1337

08/2006

Abstract

Advances in STEM Techniques for Materials Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Title: High Resolution EELS in the IBM Sub-Angstrom STEM
Creators: P E Batson - IBM Thomas J Watson Research Center
Publication Details: Microscopy and microanalysis, Vol.12(S02), pp.1336-1337
Date published: 08/2006
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: Physics and Astronomy (SAS)
Language: English
Resource Type: Journal article
Identifiers: 991031665800104646