(Invited) Electron Spectroscopic Measurements of Band Alignment in Metal/Oxide/Semiconductor Stacks

Journal article

ECS transactions, Vol.33(3), pp.267-279

12/17/2019

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Title: (Invited) Electron Spectroscopic Measurements of Band Alignment in Metal/Oxide/Semiconductor Stacks
Creators: Sylvie Rangan
Eric Bersch
Robert Bartynski
Eric Garfunkel
Elio Vescovo
Publication Details: ECS transactions, Vol.33(3), pp.267-279
Date published: 12/17/2019
Academic Unit: Physics and Astronomy (SAS); Laboratory for Surface Modification; Rutgers Global
Language: English
Resource Type: Journal article
Identifiers: 991031665905604646