Monochromated STEM with high energy and spatial resolutions

Journal article

Peer reviewed

O.L Krivanek, T.C Lovejoy, G.J Corbin, N Dellby, M.F Murfitt, N Kurz, P.E Batson and R.W Carpenter

Microscopy and microanalysis, Vol.18(S2), pp.330-331

07/2012

PMID: 23191110

Abstract

Applications of Aberration-Corrected STEM and SEM-04

Instrumentation Symposium

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

7 Record Views

Title: Monochromated STEM with high energy and spatial resolutions
Creators: O.L Krivanek - 1Nion, Kirkland, WA
T.C Lovejoy - 1Nion, Kirkland, WA
G.J Corbin - 1Nion, Kirkland, WA
N Dellby - 1Nion, Kirkland, WA
M.F Murfitt - 1Nion, Kirkland, WA
N Kurz - 1Nion, Kirkland, WA
P.E Batson - 2Rutgers University, Piscataway, NJ
R.W Carpenter - 3Arizona State University, Tempe, AZ
Publication Details: Microscopy and microanalysis, Vol.18(S2), pp.330-331
Date published: 07/2012
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: Physics and Astronomy (SAS)
Language: English
Resource Type: Journal article
Identifiers: 991031664351404646