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Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope
Journal article   Peer reviewed

Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope

P.E Batson
Ultramicroscopy, Vol.18(1), pp.125-129
1985

Abstract

A brief description of a Wien filter energy-loss spectrometer design for the STEM is given. The performance limit of the device is about 80 meV resolution at 1 mrad semi-angle. At a 12.5 mrad semi-angle referred to the specimen, the total system delivers 0.35 eV resolution, limited mainly by the field emission tunneling width. Various experimental results are compared to results from other spectrometers.

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