Random Walks to Identify Anomalous Free-Form Spatial Scan Windows

Journal article

Vandana P JANEJA and Vijayalakshmi ATLURI

IEEE transactions on knowledge and data engineering, Vol.20(10), pp.1378-1392

2008

Abstract

Data processing. List processing. Character string processing

Applied sciences

Software

Memory organisation. Data processing

Exact sciences and technology

Computer science; control theory; systems

4 Record Views

Title: Random Walks to Identify Anomalous Free-Form Spatial Scan Windows
Creators: Vandana P JANEJA - Information Systems Department, University of Maryland, Baltimore County, 1000 Hilltop Circle, Baltimore, MD 21250, United States
Vijayalakshmi ATLURI - Management Science and Information Systems Department and Center for Information Management, Integration and Connectivity (CIMIC), Rutgers University, Room 200R, Ackerson Hall, 180 University Avenue, Newark, NJ 07102, United States
Publication Details: IEEE transactions on knowledge and data engineering, Vol.20(10), pp.1378-1392
Date published: 2008
Publisher: IEEE Computer Society
Academic Unit: Management Science and Information Systems (RBS); Part-time Lecturers - Newark (RBS)
Language: English
Resource Type: Journal article
Identifiers: 991031654719704646