Sub-Angstrom Probe Size in HADF-STEM at 120KV

Journal article

Peer reviewed

P.E Batson, N Dellby and O.L Krivanek

Microscopy and microanalysis, Vol.8(S02), pp.14-15

08/2002

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Title: Sub-Angstrom Probe Size in HADF-STEM at 120KV
Creators: P.E Batson - IBM T.J. Watson Research Center, Yorktown Heights, New York 10598
N Dellby - Nion, Inc., Kirkland, Washington
O.L Krivanek - Nion, Inc., Kirkland, Washington
Publication Details: Microscopy and microanalysis, Vol.8(S02), pp.14-15
Date published: 08/2002
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: Physics and Astronomy (SAS)
Language: English
Resource Type: Journal article
Identifiers: 991031665021904646